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Tim Cousins & Associate have entered into a period testing agreement with the
CSIRO Integrated Systems and Devices Group, CSIRO Manufacturing
Bayview Avenue, Clayton, Victoria 3168.

This gives us access to the following
Materials Interrogation Equipment

Spectroscopy/Spectrometry
Nuclear Magnetic Resonance (NMR) Spectroscopy
Solution, solid state, multinuclear

Mass Spectrometry (MS)
GCMS, electron impact, chemical ionisation, atmospheric pressure chemical ionisation – volatile, less polar compounds
Headspace GCMS, Pyrolysis GCMS
LCMS, electrospray ionisation – soluble, polar compounds
MALDI – higher molecular weight, solid samples, e.g. polymers, proteins
MALDI imaging

Infrared Spectroscopy (FTIR)
Transmission, reflectance, ATR
Solution, gas, solid samples
Microscopy
Transmission, reflectance, ATR
IR imaging

Ultraviolet-Visible-NIR (UV-Vis-NIR) Spectroscopy
Transmission and reflectance measurements of transparent samples
Reflectance measurements of opaque samples
Liquid and solid samples

X-ray Photoelectron Spectroscopy (XPS)
Surface-sensitive elemental and functional group analysis
Mapping
Ion etch depth profiling
UV photoelectron spectroscopy
Inelastic scattering spectroscopy (ISS)

Inductively-Coupled Plasma Optical Emission Spectroscopy (ICP-OES)
Elemental analysis (not H, He, B, C, N, O, halogens, noble gases)

Inductively-Coupled Plasma Mass Spectrometry (ICP-MS) *Mineral Resources
Elemental analysis

LECO Elemental Analysis *Mineral Resources
H, N, O, S

Microscopy
Scanning Electron Microscopy (SEM)
Field emission, variable pressure, backscattered
CryoSEM
EDXS elemental analysis
3D imaging

Transmission Electron Microscopy (TEM)
CryoTEM
Electron diffraction
EDXS, EELS

Laser confocal microscopy
Surface roughness, metrology

Optical microscopy
Reflected, transmitted, polarisation, bright field, differential interference contrast (DIC)
Digital imaging

Atomic Force Microscopy (AFM)
Surface force measurements
Surface roughness
Nanoscale imaging
Nanoindentation, nanolithography

Chromatography
Ultra High Performance Liquid Chromatography (HPLC/UHPLC)
Analytical and preparative
Reverse and normal phases
UV-Vis, refractive index, light scattering, conductivity, electrospray ionisation detectors

Gel Permeation Chromatography (GPC) [Size Exclusion Chromatography (SEC)]
UV-Vis, refractive index, light scattering detectors
Aqueous and organic
Absolute molecular weight

Thermal and Mechanical Analysis
Differential Scanning Calorimetry (DSC)
-150 to 1500°C

Thermogravimetic Analysis (TGA)
Ambient to 1500°C
Inert, oxidative, reductive, humid atmospheres

Simultaneous DSC-TGA with evolved gas analysis

TGA-GC-MS

Dynamic Mechanical Analysis (DMA)

Dynamic Thermal Analysis (DTA)

Universal testing (Instron)

Rheometry

Transmission Rate Determination
Water vapour, oxygen

Dilatometry
Inert or vacuum

Laser flash thermal diffusivity/conductivity

X-ray analysis
X-ray Diffraction (XRD)
Fibres, powder, solids, thin films, liquids
Macro and micro analysis for crystalline phase identification
Powder and micro XRD with simultaneous XRF capabilities
Crystalline phase mapping at resolutions down to 5 microns (parallel beam optics)
In situ XRD capability - corrosion cells, UV exposure, high and low temperature environments
Quantitative crystalline phase analysis utilising the Rietveld technique
Residual stress analysis

Portable X-ray Fluorescence (XRF )
Qualitative and quantitative analysis